FormFactor FRT Metrology

W3 Fair+Convention 2020

Booth A24

MicroSpy® Mobile - Ready to Use Wherever You Need It

More flexibility due to compact design and safe transport in a roller case

Whether large machine, difficult to access vehicle interior, permanently mounted roller or bulky glass pane: If measurements have to be taken "on site", the compact and portable 3D measuring tool MicroSpy® Mobile, which weights only five kilograms, is ready to use within a few minutes.

New and specially designed for the MicroSpy® Mobile is a high-quality roller case. It ensures the safe transport of all components of the 3D measuring system.

FormFactor FRT Metrology manufactures 3D surface measurement technology for research and production. Our high-precision measuring instruments are based on SurfaceSensTM multi-sensor concept and are equipped with in-house developed software.

The multiple award-winning measuring systems provide (also fully automatically) information about topography, step height, roughness, layer thickness and many other parameters, contact-free and non-destructive. Depending on the application, different measuring methods can be combined with point, line, area and layer thickness sensors and atomic force microscopy in one measuring instrument - measuring ranges can vary from meters to sub-nanometers. The FormFactor FRT MicroProf® is well established in semiconductor front end, advanced packaging, MEMS, VCSEL, automotive, engineering and optics.

FormFactor, Inc. is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.

Products

non-contact profilometer, confocal microscope, multi-sensor technology, automation technology
Non-contact surface metrology, defect inspection, multi-sensor technology, fully automatic measuring devices, thickness measurement, topography measurement, coating thickness measurement, distance sensors, coating thickness sensors, spectrometers, confocal microscopes, white light interferometers, atomic force microscopes